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Will a "normal" SMART SAS disk show such programs as AIDA64, CrystalDiskInfo if it is connected in HBA (JBOD) mode through a raid controller?
Now the disks are installed through the HP P410 raid controller, nothing informative is visible through the controller software except for the name, serial number and rotation speed of the connected disks. If you connect a disk / disks with a SAS interface to a controller that can work as an HBA (IT-mode, JBOD), will you see a full-fledged SMART (bad sectors, operating time and other useful information)?
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Connected to the HBA, the appearance of Smart has not changed, the conclusion is that the SATA-like appearance of SMART cannot be viewed on SAS disks (I was personally interested most of all in operating hours and bad blocks)
The most "punching" utility for viewing disk status is smartmontools. She has the most complete possibilities in Linux, but in Windows she can partially do something.
The list of supported controllers, "through which" requests are supported, is here:
https://www.smartmontools.org/wiki/Supported_RAID-...
I'm not sure about AIDA64 and CrystalDiskInfo, but I believe that they will have fewer abilities
smartmontools in cciss mode makes its way through HPE raids, including those not in HBA mode.
Displays normal SMART on SATA drives, even if the drive is in a raid.
It shows even more than the native HPE tool.
But I did not succeed in tearing out SATA-like counters from the SAS disk.
# hpssacli controller slot=0 physicaldrive 1I:1:1 show detail
Smart Array P440ar in Slot 0 (Embedded)
array A
physicaldrive 1I:1:1
Port: 1I
Box: 1
Bay: 1
Status: OK
Drive Type: Data Drive
Interface Type: SAS
Size: 300 GB
Drive exposed to OS: False
Native Block Size: 512
Rotational Speed: 10500
Firmware Revision: HPD1
Serial Number: ***
Model: HP EG000300JWEBF
Current Temperature (C): 32
Maximum Temperature (C): 47
PHY Count: 2
PHY Transfer Rate: 12.0Gbps, Unknown
Drive Authentication Status: OK
Carrier Application Version: 11
Carrier Bootloader Version: 6
Sanitize Erase Supported: False
# smartctl --device=cciss,0 --all /dev/sg0
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.15.18-11-pve] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Vendor: HP
Product: EG000300JWEBF
Revision: HPD1
Compliance: SPC-4
User Capacity: 300,000,000,000 bytes [300 GB]
Logical block size: 512 bytes
Rotation Rate: 10500 rpm
Form Factor: 2.5 inches
Logical Unit id: 0x5000c5009f05dbf7
Serial number: ***
Device type: disk
Transport protocol: SAS (SPL-3)
Local Time is: Sat May 16 16:37:20 2020 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
Temperature Warning: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Health Status: OK
Current Drive Temperature: 32 C
Drive Trip Temperature: 60 C
Manufactured in week 11 of year 2017
Specified cycle count over device lifetime: 10000
Accumulated start-stop cycles: 54
Specified load-unload count over device lifetime: 300000
Accumulated load-unload cycles: 1158
Elements in grown defect list: 0
Vendor (Seagate) cache information
Blocks sent to initiator = 3189019453
Blocks received from initiator = 4120861734
Blocks read from cache and sent to initiator = 2196675622
Number of read and write commands whose size <= segment size = 211373573
Number of read and write commands whose size > segment size = 0
Vendor (Seagate/Hitachi) factory information
number of hours powered up = 26771.67
number of minutes until next internal SMART test = 42
Error counter log:
Errors Corrected by Total Correction Gigabytes Total
ECC rereads/ errors algorithm processed uncorrected
fast | delayed rewrites corrected invocations [10^9 bytes] errors
read: 0 0 0 0 0 32419.104 0
write: 0 0 0 0 0 8797.122 0
Non-medium error count: 75
No self-tests have been logged
# smartctl --device=cciss,1 --all /dev/sg0
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.15.18-11-pve] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: HPE Read-Intensive 800/960G SSDs (Intel S3510/3520 Series SSDs)
Device Model: VK0800GEYJT
Serial Number: ***
LU WWN Device Id: 5 5cd2e4 14da045ce
Firmware Version: 4IWTHPG1
User Capacity: 800,166,076,416 bytes [800 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat May 16 16:43:50 2020 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 95) minutes.
Conveyance self-test routine
recommended polling time: ( 95) minutes.
SCT capabilities: (0x0039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 130 130 039 Pre-fail Always - 4294967295
5 Reallocated_Sector_Ct 0x0033 100 100 001 Pre-fail Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 26768
173 Unknown_Attribute 0x0033 072 072 001 Pre-fail Always - 0
175 Power_Loss_Cap_Test 0x0033 100 100 010 Pre-fail Always - 6780 (153 8248)
180 Unused_Rsvd_Blk_Cnt_Tot 0x003b 130 130 039 Pre-fail Always - 4294967295
194 Temperature_Internal 0x0022 100 100 000 Old_age Always - 31
196 Reallocated_Event_Count 0x0033 100 100 010 Pre-fail Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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